Image super-resolution (SR) aims to learn a mapping from low-resolution (LR) to high-resolution (HR) using paired HR-LR training images. Conventional SR methods typically gather the paired training data by synthesizing LR images from HR images using a predetermined degradation model, e.g., Bicubic down-sampling.

The increased adoption of Internet of Things (IoT) devices has led to the generation of large data streams with applications in healthcare, sustainability, and robotics. In some cases, deep neural networks have been deployed directly on these resource-constrained units to limit communication overhead, increase efficiency and privacy, and enable real-time applications. However, a common challenge in this setting is the continuous adaptation of models necessary to accommodate changing environments, i.e., data distribution shifts. Test-time adaptation (TTA) has emerged as one potential solution, but its validity has yet to be explored in resource-constrained hardware settings, such as those involving microcontroller units (MCUs). TTA on constrained devices generally suffers from i) memory overhead due to the full backpropagation of a large pre-trained network, ii) lack of support for normalization layers on MCUs, and iii) either memory exhaustion with large batch sizes required for updating or poor performance with small batch sizes.

Image super-resolution (SR) aims to learn a mapping from low-resolution (LR) to high-resolution (HR) using paired HR-LR training images. Conventional SR methods typically gather the paired training data by synthesizing LR images from HR images using a predetermined degradation model, e.g., Bicubic down-sampling. To address this, existing methods attempt to estimate the degradation model and train an image-specific model, which, however, is quite time-consuming and impracticable to handle rapidly changing domain shifts. Moreover, these methods largely concentrate on the estimation of one degradation type (e.g., blur degradation), overlooking other degradation types like noise and JPEG in real-world test-time scenarios, thus limiting their practicality. To tackle these problems, we present an efficient test-time adaptation framework for SR, named SRTTA, which is able to quickly adapt SR models to test domains with different/unknown degradation types. Specifically, we design a second-order degradation scheme to construct paired data based on the degradation type of the test image, which is predicted by a pre-trained degradation classifier.